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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">blackmet</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений. Черная Металлургия</journal-title><trans-title-group xml:lang="en"><trans-title>Izvestiya. Ferrous Metallurgy</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0368-0797</issn><issn pub-type="epub">2410-2091</issn><publisher><publisher-name>National University of Science and Technology "MISIS"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17073/0368-0797-2024-1-121-131</article-id><article-id custom-type="elpub" pub-id-type="custom">blackmet-2686</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ИНФОРМАЦИОННЫЕ ТЕХНОЛОГИИ И АВТОМАТИЗАЦИЯ В ЧЕРНОЙ  МЕТАЛЛУРГИИ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>INFORMATION TECHNOLOGIES AND AUTOMATIC CONTROL IN FERROUS METALLURGY</subject></subj-group></article-categories><title-group><article-title>Контрольные карты Шухарта – простой, но не лёгкий для применения инструмент анализа данных</article-title><trans-title-group xml:lang="en"><trans-title>Shewhart control charts – A simple but not easy tool for data analysis</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Шпер</surname><given-names>В. Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Shper</surname><given-names>V. L.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Владимир Львович Шпер, к.т.н., доцент кафедры сертификации и аналитического контроля</p><p>Россия, 119049, Москва, Ленинский пр., 4</p></bio><bio xml:lang="en"><p>Vladimir L. Shper, Cand. Sci. (Eng.), Assist. Prof. of the Chair of Certification and Analytical Control</p><p>4 Leninskii Ave., Moscow 119049, Russian Federation</p></bio><email xlink:type="simple">vlad.shper@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Шереметьева</surname><given-names>С. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Sheremetyeva</surname><given-names>S. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Светлана Алексеевна Шереметьева, аспирант кафедры сертификации и аналитического контроля</p><p>Россия, 119049, Москва, Ленинский пр., 4</p></bio><bio xml:lang="en"><p>Svetlana A. Sheremetyeva, Postgraduate of the Chair of Certification and Analytical Control</p><p>4 Leninskii Ave., Moscow 119049, Russian Federation</p></bio><email xlink:type="simple">prosto_sveta92@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-9438-4054</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Смелов</surname><given-names>В. Ю.</given-names></name><name name-style="western" xml:lang="en"><surname>Smelov</surname><given-names>V. Yu.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Владимир Юрьевич Смелов, к.т.н., старший преподаватель кафедры сертификации и аналитического контроля, Национальный исследовательский технологический университет «МИСИС»; заместитель генерального директора по качеству, «ГПБ Комплект» (АО)</p><p>Россия, 119049, Москва, Ленинский пр., 4</p><p>Россия, 11505, Москва, Валовая ул., 6</p></bio><bio xml:lang="en"><p>Vladimir Yu. Smelov, Cand. Sci. (Eng.), Senior Lecturer of the Chair of Certification and Analytical Control, National University of Science and Technology “MISIS”; Deputy General Director of Quality, GPB Complect (JSC)</p><p>4 Leninskii Ave., Moscow 119049, Russian Federation</p><p>6 Valovaya Str., Moscow 11505, Russian Federation</p></bio><email xlink:type="simple">b.c.21@mail.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2396-6911</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Хунузиди</surname><given-names>Е. И.</given-names></name><name name-style="western" xml:lang="en"><surname>Khunuzidi</surname><given-names>E. I.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Елена Ивановна Хунузиди, к.т.н., доцент кафедры сертификации и аналитического контроля, Национальный исследовательский технологический университет «МИСИС»; руководитель отдела по обеспечению качества, ООО «АтомТехноТест»</p><p>Россия, 119049, Москва, Ленинский пр., 4</p><p>Россия, Москва, 123022, 2-я Звенигородская ул., 13, стр. 37</p></bio><bio xml:lang="en"><p>Elena I. Khunuzidi, Cand. Sci. (Eng.), Assist. Prof. of the Chair of Certification and Analytical Control, National University of Science and Technology “MISIS”; Head of Division of Quality Assurance, LLC “AtomTekhnoTest”</p><p>4 Leninskii Ave., Moscow 119049, Russian Federation</p><p>13 bld. 37 2nd Zvenigorodskaya Str., Moscow 123022, Russian Federation</p></bio><email xlink:type="simple">el_hun@mail.ru</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный исследовательский технологический университет «МИСИС»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National University of Science and Technology “MISIS”</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Национальный исследовательский технологический университет «МИСИС»; «ГПБ Комплект» (АО)</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National University of Science and Technology “MISIS”; GPB Complect (JSC)</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Национальный исследовательский технологический университет «МИСИС»; ООО «АтомТехноТест»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National University of Science and Technology “MISIS”; LLC “AtomTekhnoTest”</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>25</day><month>02</month><year>2024</year></pub-date><volume>67</volume><issue>1</issue><fpage>121</fpage><lpage>131</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Шпер В.Л., Шереметьева С.А., Смелов В.Ю., Хунузиди Е.И., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Шпер В.Л., Шереметьева С.А., Смелов В.Ю., Хунузиди Е.И.</copyright-holder><copyright-holder xml:lang="en">Shper V.L., Sheremetyeva S.A., Smelov V.Y., Khunuzidi E.I.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://fermet.misis.ru/jour/article/view/2686">https://fermet.misis.ru/jour/article/view/2686</self-uri><abstract><p>Контрольные карты Шухарта (ККШ) – мощный и технически весьма простой инструмент анализа вариабельности процессов, но  одновременно он не может быть полностью алгоритмизирован и требует глубокого знания процесса в сочетании с дополнительным анализом данных. Хотя сами по себе ККШ известны очень давно, число работ огромно и стандарты на применение карт внедрены в большинстве стран мира, существует несколько принципиально важных проблем их эффективного применения, которые практически не находят своего отражения ни в научно-исследовательской, ни в учебной литературе. Именно этим проблемам и посвящена данная работа. В частности, исследованы два аспекта стандартного допущения о нормальности закона распределения данных. Сначала авторы изучили широко распространенное заблуждение о том, что результаты измерений всегда распределены в соответствии с законом Гаусса. Затем показали, что отклонение реальной функции распределения данных от нормальности может при определенных условиях приводить к существенным изменениям в методике построения и интерпретации контрольных карт. Далее, на примере конкретного процесса, было рассмотрено, как правильно и как неправильно строить и интерпретировать ККШ, после чего исследована принципиально важная проблема операционального определения особых/специальных причин вариаций. Авторы предлагают ввести два типа особых причин: не меняющих (I-тип) и изменяющих (X-тип) систему. В конце работы рассмотрен вопрос о том, как правильно организовать работу с ККШ. Подчеркнуто, что построение и интерпретация контрольной карты – это всегда системная проблема взаимодействия между процессами и людьми, работающими над улучшением этих процессов.</p></abstract><trans-abstract xml:lang="en"><p>Shewhart control charts (ShCCs) are a powerful and technically simple tool for process variability analysis. However, simultaneously, they cannot be fully algorithmized and require deep process knowledge together with additional data analysis. ShCCs are well known, though, and the number of papers is great, as well as standards on ShCCs work in most countries, there are some serious obstacles for their effective application which are not being discussed in either educational or scientific literature. Just these problems are being considered in this paper. We analyzed two sides of standard assumption about data normality. First, we discuss the widely-spread misconception that measurement data are always distribu­ted according Gauss law. Then, it is shown how the deviation from normality may impact the method of ShCCs’ constructing and interpreting. Using a specific process data, we debate on right and wrong ways to build ShCC. Further, the paper describes two new definitions of assignable causes of variation: not changing (I-type) and changing (X-type) the system. At the end, we discuss how the work with ShCCs should be organized effectively. It is outlined that creating and analyzing ShCCs is always a system question of interaction between the process and the person who tries to improve this process.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>контрольные карты Шухарта</kwd><kwd>ненормальность</kwd><kwd>индексы воспроизводимости</kwd><kwd>построение карт</kwd></kwd-group><kwd-group xml:lang="en"><kwd>Shewhart control charts</kwd><kwd>non-normality</kwd><kwd>capability indices</kwd><kwd>chart construction</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Shewhart W. Economic Control of Quality of Manufactured Product. Milwaukee: ASQ Quality Press.; 1980:501.</mixed-citation><mixed-citation xml:lang="en">Shewhart W. Economic Control of Quality of Manufactured Product. Milwaukee: ASQ Quality Press.; 1980:501.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Shewhart W. Statistical Methods from the Viewpoint of Quality Control. N.Y.: Dover Publications, Inc.; 1986:163.</mixed-citation><mixed-citation xml:lang="en">Shewhart W. Statistical Methods from the Viewpoint of Quality Control. N.Y.: Dover Publications, Inc.; 1986:163.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Kume H. Statistical Methods for Quality Improvement. The Association for Overseas Technical Scholarship (AOTS); 1985:231.</mixed-citation><mixed-citation xml:lang="en">Kume H. Statistical Methods for Quality Improvement. The Association for Overseas Technical Scholarship (AOTS); 1985:231.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Wheeler D. Advanced Topics in Statistical Process Control. Knoxville: SPC Press, Inc.; 1995:484.</mixed-citation><mixed-citation xml:lang="en">Wheeler D. Advanced Topics in Statistical Process Control. Knoxville: SPC Press, Inc.; 1995:484.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Alwan L.C. Statistical Process Analysis. Irwin: McGrow-Hill series in operations and decision sciences; 2000:768.</mixed-citation><mixed-citation xml:lang="en">Alwan L.C. Statistical Process Analysis. Irwin: McGrow-Hill series in operations and decision sciences; 2000:768.</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">Rinne H., Mittag H-J. Statistische Methoden der Quali­tätssicherung. Fernuniversität-Gesamthochschule-in-Hagen, Deutschland, Fachbereich Wirtschaftswissenschaft; 1993: 615. (In Germ.).</mixed-citation><mixed-citation xml:lang="en">Rinne H., Mittag H-J. Statistische Methoden der Quali­tätssicherung. Fernuniversität-Gesamthochschule-in-Hagen, Deutschland, Fachbereich Wirtschaftswissenschaft; 1993: 615. (In Germ.).</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Schindowski E., Schürz O. Statistische Qualitätskontrolle. Berlin: Veb Verlag Technik; 1974:636. (In Germ.).</mixed-citation><mixed-citation xml:lang="en">Schindowski E., Schürz O. Statistische Qualitätskontrolle. Berlin: Veb Verlag Technik; 1974:636. (In Germ.).</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Murdoch J. Control Charts. The Macmillan Press, Ltd; 1979:150.</mixed-citation><mixed-citation xml:lang="en">Murdoch J. Control Charts. The Macmillan Press, Ltd; 1979:150.</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Montgomery D.C. Introduction to Statistical Quality Cont­rol. 6th ed. John Wiley &amp; Sons; 2009:752.</mixed-citation><mixed-citation xml:lang="en">Montgomery D.C. Introduction to Statistical Quality Cont­rol. 6th ed. John Wiley &amp; Sons; 2009:752.</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Balestracci D. Data Sanity: A Quantum Leap to Unprecedented Results. Medical Group Management Association; 2009:326.</mixed-citation><mixed-citation xml:lang="en">Balestracci D. Data Sanity: A Quantum Leap to Unprecedented Results. Medical Group Management Association; 2009:326.</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">ГОСТ Р ИСО 7870-2-2015. Статистические методы. Контрольные карты. Часть 2. Контрольные карты Шухарта. М.: ФГУП «СТАНДАРТИНФОРМ»; 2016:46.</mixed-citation><mixed-citation xml:lang="en">ISO 7870-2:2013. Control Charts – part 2: Shewhart Control Charts.</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">Шереметьева С.А., Шпер В.Л. Бизнес и теория вариабельности: дружба или непонимание. Стандарты и качество. 2022;(2):92–97. http://doi.org/10.35400/0038-9692-2022-2-72-21</mixed-citation><mixed-citation xml:lang="en">Sheremetyeva S.A., Shper V.L. Business and variation: friendship or misunderstanding. Standards and Quality. 2022;(2):92–97. (In Russ.). http://doi.org/10.35400/0038-9692-2022-2-72-21</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Adler Y., Shper V., Maksimova O. Assignable causes of variation and statistical models: Another approach to an old topic. Quality and Reliability Engineering International. 2011;27(5):623–628. https://doi.org/10.1002/qre.1207</mixed-citation><mixed-citation xml:lang="en">Adler Y., Shper V., Maksimova O. Assignable causes of variation and statistical models: Another approach to an old topic. Quality and Reliability Engineering International. 2011;27(5):623–628. https://doi.org/10.1002/qre.1207</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">Shper V., Adler Y. The importance of time order with Shewhart control charts. Quality and Reliability Engineering International. 2017;33(6):1169–1177. http://doi.org/10.1002/qre.2185</mixed-citation><mixed-citation xml:lang="en">Shper V., Adler Y. The importance of time order with Shewhart control charts. Quality and Reliability Engineering International. 2017;33(6):1169–1177. http://doi.org/10.1002/qre.2185</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">Shper V., Gracheva A. Simple Shewhart control charts: Are they really so simple? International Journal of Industrial and Operations Research. 2021;4(1):010. http://doi.org/10.35840/2633-8947/6510</mixed-citation><mixed-citation xml:lang="en">Shper V., Gracheva A. Simple Shewhart control charts: Are they really so simple? International Journal of Industrial and Operations Research. 2021;4(1):010. http://doi.org/10.35840/2633-8947/6510</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">Deming W. Out of Crisis. Cambridge, Massachusetts: The MIT Press; 1987:524.</mixed-citation><mixed-citation xml:lang="en">Deming W. Out of Crisis. Cambridge, Massachusetts: The MIT Press; 1987:524.</mixed-citation></citation-alternatives></ref><ref id="cit17"><label>17</label><citation-alternatives><mixed-citation xml:lang="ru">Shper V., Sheremetyeva S. The impact of non-normali­ty on the control limits of Shewhart’s charts. Тяжелое машиностроение. 2022;(1–2):16–29.</mixed-citation><mixed-citation xml:lang="en">Shper V., Sheremetyeva S. The impact of non-normality on the control limits of Shewhart’s charts. Tyazheloye Mashinostroyeniye. 2022;(1–2):16–29.</mixed-citation></citation-alternatives></ref><ref id="cit18"><label>18</label><citation-alternatives><mixed-citation xml:lang="ru">Ryan T.A, Joiner B.L. Normal Probability Plots and Tests for Normality. Available at: https://www.additive-net.de/de/component/jdownloads/send/70-support/236-normal-probability-plots-and-tests-for-normality-thomas-a-ryan-jr-bryan-l-joiner</mixed-citation><mixed-citation xml:lang="en">Ryan T.A, Joiner B.L. Normal Probability Plots and Tests for Normality. Available at: https://www.additive-net.de/de/component/jdownloads/send/70-support/236-normal-probability-plots-and-tests-for-normality-thomas-a-ryan-jr-bryan-l-joiner</mixed-citation></citation-alternatives></ref><ref id="cit19"><label>19</label><citation-alternatives><mixed-citation xml:lang="ru">Уилер Д., Чамберс Д. Статистическое управление процессами. Оптимизация бизнеса с использованием контрольных карт Шухарта. Москва: Альпина Бизнес Букс; 2009:409.</mixed-citation><mixed-citation xml:lang="en">Wheeler D.J., Chambers D.S. Understanding Statistical Process Control. 2nd ed. Knoxville: SPC Press, Inc.; 1992:428.</mixed-citation></citation-alternatives></ref><ref id="cit20"><label>20</label><citation-alternatives><mixed-citation xml:lang="ru">Адлер Ю.П. Алгоритмически неразрешимые задачи и искусственный интеллект. Экономика и управление: проб­лемы, решения. 2018;7/77(5):17–24.</mixed-citation><mixed-citation xml:lang="en">Adler Yu.P. Algorithmically unsolvable problems and artificial intellect. Economics and management: problems, solutions. 2018;7/77(5):17–24. (In Russ.).</mixed-citation></citation-alternatives></ref><ref id="cit21"><label>21</label><citation-alternatives><mixed-citation xml:lang="ru">Jensen W., Szarka J. III, White K. A better picture. Quality Progress. 2020;53(1):41–49.</mixed-citation><mixed-citation xml:lang="en">Jensen W., Szarka J. III, White K. A better picture. Quality Progress. 2020;53(1):41–49.</mixed-citation></citation-alternatives></ref><ref id="cit22"><label>22</label><citation-alternatives><mixed-citation xml:lang="ru">Woodall W. Controversies and contradictions in statistical process control. Journal of Quality Technology. 2000;32(4):341–350. https://doi.org/10.1080/00224065.2000.11980013</mixed-citation><mixed-citation xml:lang="en">Woodall W. Controversies and contradictions in statistical process control. Journal of Quality Technology. 2000;32(4):341–350. https://doi.org/10.1080/00224065.2000.11980013</mixed-citation></citation-alternatives></ref><ref id="cit23"><label>23</label><citation-alternatives><mixed-citation xml:lang="ru">Deming W. The Essential Deming. Leadership Principles from the Father of Quality. Orsini J. ed. N.Y.:McGrow-Hill; 2013:336.</mixed-citation><mixed-citation xml:lang="en">Deming W. The Essential Deming. Leadership Principles from the Father of Quality. Orsini J. ed. N.Y.:McGrow-Hill; 2013:336.</mixed-citation></citation-alternatives></ref><ref id="cit24"><label>24</label><citation-alternatives><mixed-citation xml:lang="ru"></mixed-citation><mixed-citation xml:lang="en"></mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
